Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-x Gex films

• Main Authors: Ko, V., Teo, K.L., Liew, T., Chong, T.C., Liu, T., Wee, A.T.S., Du, A.Y., Stoffel, M., Schmidt, O.G.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/55457
• Institution: National University of Singapore

10.1063/1.2842404