Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure
10.1109/LED.2005.863132
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sg-nus-scholar.10635-556472023-10-26T07:40:46Z Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure Mahalingam, U. Rustagi, S.C. Samudra, G.S. ELECTRICAL & COMPUTER ENGINEERING CMOS RF modeling RF MOSFET parameter extraction Substrate network Substrate resistance 10.1109/LED.2005.863132 IEEE Electron Device Letters 27 2 130-132 EDLED 2014-06-17T02:45:31Z 2014-06-17T02:45:31Z 2006-02 Article Mahalingam, U., Rustagi, S.C., Samudra, G.S. (2006-02). Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure. IEEE Electron Device Letters 27 (2) : 130-132. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2005.863132 07413106 http://scholarbank.nus.edu.sg/handle/10635/55647 000234850400017 Scopus |
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CMOS RF modeling RF MOSFET parameter extraction Substrate network Substrate resistance |
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CMOS RF modeling RF MOSFET parameter extraction Substrate network Substrate resistance Mahalingam, U. Rustagi, S.C. Samudra, G.S. Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure |
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10.1109/LED.2005.863132 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Mahalingam, U. Rustagi, S.C. Samudra, G.S. |
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Article |
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Mahalingam, U. Rustagi, S.C. Samudra, G.S. |
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Mahalingam, U. |
title |
Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure |
title_short |
Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure |
title_full |
Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure |
title_fullStr |
Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure |
title_full_unstemmed |
Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure |
title_sort |
direct extraction of substrate network parameters for rf mosfet modeling using a simple test structure |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55647 |
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1781412166185779200 |