Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure

Direct extraction of substrate network parameters for RF MOSFET modeling using a simple test structure

10.1109/LED.2005.863132

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Bibliographic Details
Main Authors: Mahalingam, U., Rustagi, S.C., Samudra, G.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
CMOS RF modeling
RF MOSFET parameter extraction
Substrate network
Substrate resistance
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55647
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/55647

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