Direct measurement of beam size in a spectroscopic ellipsometry setup

10.1063/1.2936262

Saved in:
Bibliographic Details
Main Authors: Tay, A., Ng, T.W., Wang, Y., Zhao, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55652
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore