Dominant feature identification for industrial fault detection and isolation applications

10.1016/j.eswa.2011.01.160

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Bibliographic Details
Main Authors: Zhou, J.-H., Pang, C.K., Lewis, F.L., Zhong, Z.-W.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55691
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Institution: National University of Singapore

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