Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case

Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case

10.1109/TMAG.2004.826627

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Bibliographic Details
Main Authors: Yin, W.Y., Li, L.W., Pan, S.J., Gan, Y.B.
Other Authors: TEMASEK LABORATORIES
Format: Article
Published: 2014
Subjects:
Circuit model
First and second resonance frequencies
On-chip shunt LC interconnect
S parameter
Wideband
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55957
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Institution: National University of Singapore
Description
Summary:10.1109/TMAG.2004.826627

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