Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case

10.1109/TMAG.2004.826627

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Bibliographic Details
Main Authors:	Yin, W.Y., Li, L.W., Pan, S.J., Gan, Y.B.
Other Authors:	TEMASEK LABORATORIES
Format:	Article
Published:	2014
Subjects:	Circuit model First and second resonance frequencies On-chip shunt LC interconnect S parameter Wideband
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55957
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-55957
record_format	dspace
spelling	sg-nus-scholar.10635-559572024-11-13T04:42:33Z Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case Yin, W.Y. Li, L.W. Pan, S.J. Gan, Y.B. TEMASEK LABORATORIES ELECTRICAL & COMPUTER ENGINEERING Circuit model First and second resonance frequencies On-chip shunt LC interconnect S parameter Wideband 10.1109/TMAG.2004.826627 IEEE Transactions on Magnetics 40 3 1657-1663 IEMGA 2014-06-17T02:49:05Z 2014-06-17T02:49:05Z 2004-05 Article Yin, W.Y., Li, L.W., Pan, S.J., Gan, Y.B. (2004-05). Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case. IEEE Transactions on Magnetics 40 (3) : 1657-1663. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2004.826627 00189464 http://scholarbank.nus.edu.sg/handle/10635/55957 000221466000024 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Circuit model First and second resonance frequencies On-chip shunt LC interconnect S parameter Wideband
spellingShingle	Circuit model First and second resonance frequencies On-chip shunt LC interconnect S parameter Wideband Yin, W.Y. Li, L.W. Pan, S.J. Gan, Y.B. Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case
description	10.1109/TMAG.2004.826627
author2	TEMASEK LABORATORIES
author_facet	TEMASEK LABORATORIES Yin, W.Y. Li, L.W. Pan, S.J. Gan, Y.B.
format	Article
author	Yin, W.Y. Li, L.W. Pan, S.J. Gan, Y.B.
author_sort	Yin, W.Y.
title	Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case
title_short	Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case
title_full	Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case
title_fullStr	Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case
title_full_unstemmed	Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case
title_sort	experimental characterization of on-chip inductor and capacitor interconnect: part ii. shunt case
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/55957
_version_	1821192559567831040

Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case

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