Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case

• Main Authors: Yin, W.Y., Li, L.W., Pan, S.J., Gan, Y.B.
• Other Authors: TEMASEK LABORATORIES
• Format: Article
• Published: 2014
• Subjects: Circuit model; First and second resonance frequencies; On-chip shunt LC interconnect; S parameter; Wideband
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/55957
• Institution: National University of Singapore

10.1109/TMAG.2004.826627