Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides
10.1063/1.1566460
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sg-nus-scholar.10635-559722024-11-10T17:47:44Z Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides Xu, M. Tan, C. Li, M. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1566460 Applied Physics Letters 82 15 2482-2484 APPLA 2014-06-17T02:49:15Z 2014-06-17T02:49:15Z 2003-04-14 Article Xu, M., Tan, C., Li, M. (2003-04-14). Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides. Applied Physics Letters 82 (15) : 2482-2484. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1566460 00036951 http://scholarbank.nus.edu.sg/handle/10635/55972 000182104900038 Scopus |
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10.1063/1.1566460 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Xu, M. Tan, C. Li, M. |
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Xu, M. Tan, C. Li, M. |
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Xu, M. Tan, C. Li, M. Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides |
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Xu, M. |
title |
Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides |
title_short |
Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides |
title_full |
Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides |
title_fullStr |
Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides |
title_full_unstemmed |
Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides |
title_sort |
extended arrhenius law of time-to-breakdown of ultrathin gate oxides |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55972 |
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