Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
10.1063/1.1846152
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sg-nus-scholar.10635-560652023-10-29T23:04:59Z Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions Yeo, Y.-C. Sun, J. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1846152 Applied Physics Letters 86 2 023103-1 APPLA 2014-06-17T02:50:18Z 2014-06-17T02:50:18Z 2005-01-10 Article Yeo, Y.-C., Sun, J. (2005-01-10). Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions. Applied Physics Letters 86 (2) : 023103-1. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1846152 00036951 http://scholarbank.nus.edu.sg/handle/10635/56065 000226701500065 Scopus |
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10.1063/1.1846152 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Yeo, Y.-C. Sun, J. |
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Yeo, Y.-C. Sun, J. |
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Yeo, Y.-C. Sun, J. Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions |
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Yeo, Y.-C. |
title |
Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions |
title_short |
Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions |
title_full |
Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions |
title_fullStr |
Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions |
title_full_unstemmed |
Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions |
title_sort |
finite-element study of strain distribution in transistor with silicon-germanium source and drain regions |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/56065 |
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1781781105118019584 |