Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions

10.1063/1.1846152

Saved in:
Bibliographic Details
Main Authors: Yeo, Y.-C., Sun, J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56065
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-56065
record_format dspace
spelling sg-nus-scholar.10635-560652023-10-29T23:04:59Z Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions Yeo, Y.-C. Sun, J. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1846152 Applied Physics Letters 86 2 023103-1 APPLA 2014-06-17T02:50:18Z 2014-06-17T02:50:18Z 2005-01-10 Article Yeo, Y.-C., Sun, J. (2005-01-10). Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions. Applied Physics Letters 86 (2) : 023103-1. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1846152 00036951 http://scholarbank.nus.edu.sg/handle/10635/56065 000226701500065 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1846152
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Yeo, Y.-C.
Sun, J.
format Article
author Yeo, Y.-C.
Sun, J.
spellingShingle Yeo, Y.-C.
Sun, J.
Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
author_sort Yeo, Y.-C.
title Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
title_short Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
title_full Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
title_fullStr Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
title_full_unstemmed Finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
title_sort finite-element study of strain distribution in transistor with silicon-germanium source and drain regions
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/56065
_version_ 1781781105118019584