Interaction of interface-traps located at various sites in MOSFETs under stress
10.1109/TR.2002.804485
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sg-nus-scholar.10635-563622024-11-10T17:47:54Z Interaction of interface-traps located at various sites in MOSFETs under stress Chen, G. Li, M.F. Jin, Y. ELECTRICAL & COMPUTER ENGINEERING Annealing Hot carrier MOSFET Semiconductor device reliability Semiconductor-insulator interface 10.1109/TR.2002.804485 IEEE Transactions on Reliability 51 4 387-391 IEERA 2014-06-17T02:53:44Z 2014-06-17T02:53:44Z 2002-12 Article Chen, G., Li, M.F., Jin, Y. (2002-12). Interaction of interface-traps located at various sites in MOSFETs under stress. IEEE Transactions on Reliability 51 (4) : 387-391. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2002.804485 00189529 http://scholarbank.nus.edu.sg/handle/10635/56362 000178991400003 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| topic |
Annealing Hot carrier MOSFET Semiconductor device reliability Semiconductor-insulator interface |
| spellingShingle |
Annealing Hot carrier MOSFET Semiconductor device reliability Semiconductor-insulator interface Chen, G. Li, M.F. Jin, Y. Interaction of interface-traps located at various sites in MOSFETs under stress |
| description |
10.1109/TR.2002.804485 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Chen, G. Li, M.F. Jin, Y. |
| format |
Article |
| author |
Chen, G. Li, M.F. Jin, Y. |
| author_sort |
Chen, G. |
| title |
Interaction of interface-traps located at various sites in MOSFETs under stress |
| title_short |
Interaction of interface-traps located at various sites in MOSFETs under stress |
| title_full |
Interaction of interface-traps located at various sites in MOSFETs under stress |
| title_fullStr |
Interaction of interface-traps located at various sites in MOSFETs under stress |
| title_full_unstemmed |
Interaction of interface-traps located at various sites in MOSFETs under stress |
| title_sort |
interaction of interface-traps located at various sites in mosfets under stress |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/56362 |
| _version_ |
1821209351037124608 |