Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy

Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy

10.1109/TED.2009.2036313

Saved in:
Bibliographic Details
Main Authors: Ke, L., Dolmanan, S.B., Vijila, C., Chua, S.J., Han, Y.H., Mei, T.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Degradation
Low frequency noise
Pentacene
Thin film transistor
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56404
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/56404

Similar Items