Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy

10.1109/TED.2009.2036313

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Bibliographic Details
Main Authors:	Ke, L., Dolmanan, S.B., Vijila, C., Chua, S.J., Han, Y.H., Mei, T.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Degradation Low frequency noise Pentacene Thin film transistor
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/56404
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-56404
record_format	dspace
spelling	sg-nus-scholar.10635-564042023-10-26T08:36:28Z Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy Ke, L. Dolmanan, S.B. Vijila, C. Chua, S.J. Han, Y.H. Mei, T. ELECTRICAL & COMPUTER ENGINEERING Degradation Low frequency noise Pentacene Thin film transistor 10.1109/TED.2009.2036313 IEEE Transactions on Electron Devices 57 2 385-390 IETDA 2014-06-17T02:54:12Z 2014-06-17T02:54:12Z 2010-02 Article Ke, L., Dolmanan, S.B., Vijila, C., Chua, S.J., Han, Y.H., Mei, T. (2010-02). Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy. IEEE Transactions on Electron Devices 57 (2) : 385-390. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2009.2036313 00189383 http://scholarbank.nus.edu.sg/handle/10635/56404 000273764800005 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Degradation Low frequency noise Pentacene Thin film transistor
spellingShingle	Degradation Low frequency noise Pentacene Thin film transistor Ke, L. Dolmanan, S.B. Vijila, C. Chua, S.J. Han, Y.H. Mei, T. Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy
description	10.1109/TED.2009.2036313
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ke, L. Dolmanan, S.B. Vijila, C. Chua, S.J. Han, Y.H. Mei, T.
format	Article
author	Ke, L. Dolmanan, S.B. Vijila, C. Chua, S.J. Han, Y.H. Mei, T.
author_sort	Ke, L.
title	Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy
title_short	Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy
title_full	Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy
title_fullStr	Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy
title_full_unstemmed	Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy
title_sort	investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/56404
_version_	1781781168446767104

Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy

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