Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy

Investigation of the device degradation mechanism in pentacene-based thin-film transistors using low-frequency-noise spectroscopy

10.1109/TED.2009.2036313

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Bibliographic Details
Main Authors: Ke, L., Dolmanan, S.B., Vijila, C., Chua, S.J., Han, Y.H., Mei, T.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Degradation
Low frequency noise
Pentacene
Thin film transistor
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56404
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Institution: National University of Singapore
Description
Summary:10.1109/TED.2009.2036313

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