Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam

Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam

10.1063/1.3070637

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Bibliographic Details
Main Authors: Chen, Y.J., Huang, T.L., Leong, S.H., Hu, S.B., Ng, K.W., Yuan, Z.M., Zong, B.Y., Shi, J.Z., Hendra, S.K., Liu, B., Ng, V.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56551
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Institution: National University of Singapore
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Summary:10.1063/1.3070637

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