Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam

• Main Authors: Chen, Y.J., Huang, T.L., Leong, S.H., Hu, S.B., Ng, K.W., Yuan, Z.M., Zong, B.Y., Shi, J.Z., Hendra, S.K., Liu, B., Ng, V.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/56551
• Institution: National University of Singapore

10.1063/1.3070637