Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam

10.1063/1.3070637

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Bibliographic Details
Main Authors:	Chen, Y.J., Huang, T.L., Leong, S.H., Hu, S.B., Ng, K.W., Yuan, Z.M., Zong, B.Y., Shi, J.Z., Hendra, S.K., Liu, B., Ng, V.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/56551
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-56551
record_format	dspace
spelling	sg-nus-scholar.10635-565512023-10-26T07:16:24Z Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam Chen, Y.J. Huang, T.L. Leong, S.H. Hu, S.B. Ng, K.W. Yuan, Z.M. Zong, B.Y. Shi, J.Z. Hendra, S.K. Liu, B. Ng, V. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.3070637 Journal of Applied Physics 105 7 - JAPIA 2014-06-17T02:55:53Z 2014-06-17T02:55:53Z 2009 Article Chen, Y.J., Huang, T.L., Leong, S.H., Hu, S.B., Ng, K.W., Yuan, Z.M., Zong, B.Y., Shi, J.Z., Hendra, S.K., Liu, B., Ng, V. (2009). Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam. Journal of Applied Physics 105 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3070637 00218979 http://scholarbank.nus.edu.sg/handle/10635/56551 000266633500388 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.3070637
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Chen, Y.J. Huang, T.L. Leong, S.H. Hu, S.B. Ng, K.W. Yuan, Z.M. Zong, B.Y. Shi, J.Z. Hendra, S.K. Liu, B. Ng, V.
format	Article
author	Chen, Y.J. Huang, T.L. Leong, S.H. Hu, S.B. Ng, K.W. Yuan, Z.M. Zong, B.Y. Shi, J.Z. Hendra, S.K. Liu, B. Ng, V.
spellingShingle	Chen, Y.J. Huang, T.L. Leong, S.H. Hu, S.B. Ng, K.W. Yuan, Z.M. Zong, B.Y. Shi, J.Z. Hendra, S.K. Liu, B. Ng, V. Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
author_sort	Chen, Y.J.
title	Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
title_short	Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
title_full	Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
title_fullStr	Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
title_full_unstemmed	Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
title_sort	magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/56551
_version_	1781781202303188992

Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam

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