Nondestructive evaluation of nanoscale structures: Inverse scattering approach
10.1007/s00339-010-5773-2
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sg-nus-scholar.10635-568102023-08-28T21:36:10Z Nondestructive evaluation of nanoscale structures: Inverse scattering approach Pan, L. Chen, X. Yeo, S.P. ELECTRICAL & COMPUTER ENGINEERING 10.1007/s00339-010-5773-2 Applied Physics A: Materials Science and Processing 101 1 143-146 APAMF 2014-06-17T02:58:52Z 2014-06-17T02:58:52Z 2010-10 Article Pan, L., Chen, X., Yeo, S.P. (2010-10). Nondestructive evaluation of nanoscale structures: Inverse scattering approach. Applied Physics A: Materials Science and Processing 101 (1) : 143-146. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-010-5773-2 09478396 http://scholarbank.nus.edu.sg/handle/10635/56810 000283097300025 Scopus |
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10.1007/s00339-010-5773-2 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Pan, L. Chen, X. Yeo, S.P. |
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Pan, L. Chen, X. Yeo, S.P. |
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Pan, L. Chen, X. Yeo, S.P. Nondestructive evaluation of nanoscale structures: Inverse scattering approach |
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Pan, L. |
title |
Nondestructive evaluation of nanoscale structures: Inverse scattering approach |
title_short |
Nondestructive evaluation of nanoscale structures: Inverse scattering approach |
title_full |
Nondestructive evaluation of nanoscale structures: Inverse scattering approach |
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Nondestructive evaluation of nanoscale structures: Inverse scattering approach |
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Nondestructive evaluation of nanoscale structures: Inverse scattering approach |
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nondestructive evaluation of nanoscale structures: inverse scattering approach |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/56810 |
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