Nondestructive evaluation of nanoscale structures: Inverse scattering approach

10.1007/s00339-010-5773-2

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Bibliographic Details
Main Authors: Pan, L., Chen, X., Yeo, S.P.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56810
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Institution: National University of Singapore