Nondestructive evaluation of nanoscale structures: Inverse scattering approach
10.1007/s00339-010-5773-2
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Main Authors: | Pan, L., Chen, X., Yeo, S.P. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56810 |
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Institution: | National University of Singapore |
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