Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy

10.1002/smll.200901173

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Bibliographic Details
Main Authors:	Hao, Y., Wang, Y., Wang, L., Ni, Z., Wang, Z., Wang, R., Koo, C.K., Shen, Z., Thong, J.T.L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/57123
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Institution:	National University of Singapore

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Summary:	10.1002/smll.200901173

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