Defects detection of plates using comparative digital speckle pattern interferometry

Optik (Jena)

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Bibliographic Details
Main Authors: Tay, C.J., Shang, H.M., Quan, C.
Other Authors: MECHANICAL & PRODUCTION ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/58064
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Institution: National University of Singapore
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Summary:Optik (Jena)