Defects detection of plates using comparative digital speckle pattern interferometry
Optik (Jena)
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sg-nus-scholar.10635-580642015-01-26T18:07:06Z Defects detection of plates using comparative digital speckle pattern interferometry Tay, C.J. Shang, H.M. Quan, C. MECHANICAL & PRODUCTION ENGINEERING Optik (Jena) 111 12 536-540 OTIKA 2014-06-17T05:10:27Z 2014-06-17T05:10:27Z 2000 Article Tay, C.J.,Shang, H.M.,Quan, C. (2000). Defects detection of plates using comparative digital speckle pattern interferometry. Optik (Jena) 111 (12) : 536-540. ScholarBank@NUS Repository. 00304026 http://scholarbank.nus.edu.sg/handle/10635/58064 NOT_IN_WOS Scopus |
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Optik (Jena) |
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MECHANICAL & PRODUCTION ENGINEERING |
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MECHANICAL & PRODUCTION ENGINEERING Tay, C.J. Shang, H.M. Quan, C. |
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Tay, C.J. Shang, H.M. Quan, C. |
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Tay, C.J. Shang, H.M. Quan, C. Defects detection of plates using comparative digital speckle pattern interferometry |
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Tay, C.J. |
title |
Defects detection of plates using comparative digital speckle pattern interferometry |
title_short |
Defects detection of plates using comparative digital speckle pattern interferometry |
title_full |
Defects detection of plates using comparative digital speckle pattern interferometry |
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Defects detection of plates using comparative digital speckle pattern interferometry |
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Defects detection of plates using comparative digital speckle pattern interferometry |
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defects detection of plates using comparative digital speckle pattern interferometry |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/58064 |
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