Impact of moisture diffusion during solder reflow on package reliability

Proceedings - Electronic Components and Technology Conference

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Main Authors: Tay, A.A.O., Lin, T.Y.
Other Authors: MECHANICAL & PRODUCTION ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/58371
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-583712024-11-13T13:23:11Z Impact of moisture diffusion during solder reflow on package reliability Tay, A.A.O. Lin, T.Y. MECHANICAL & PRODUCTION ENGINEERING Proceedings - Electronic Components and Technology Conference 830-836 PECCA 2014-06-17T05:13:48Z 2014-06-17T05:13:48Z 1999 Article Tay, A.A.O.,Lin, T.Y. (1999). Impact of moisture diffusion during solder reflow on package reliability. Proceedings - Electronic Components and Technology Conference : 830-836. ScholarBank@NUS Repository. 05695503 http://scholarbank.nus.edu.sg/handle/10635/58371 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Proceedings - Electronic Components and Technology Conference
author2 MECHANICAL & PRODUCTION ENGINEERING
author_facet MECHANICAL & PRODUCTION ENGINEERING
Tay, A.A.O.
Lin, T.Y.
format Article
author Tay, A.A.O.
Lin, T.Y.
spellingShingle Tay, A.A.O.
Lin, T.Y.
Impact of moisture diffusion during solder reflow on package reliability
author_sort Tay, A.A.O.
title Impact of moisture diffusion during solder reflow on package reliability
title_short Impact of moisture diffusion during solder reflow on package reliability
title_full Impact of moisture diffusion during solder reflow on package reliability
title_fullStr Impact of moisture diffusion during solder reflow on package reliability
title_full_unstemmed Impact of moisture diffusion during solder reflow on package reliability
title_sort impact of moisture diffusion during solder reflow on package reliability
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/58371
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