Capacitance-voltage measurements on MOS capacitors fabricated on polycrystalline silicon wafers

Applied Surface Science

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Bibliographic Details
Main Authors: Ling, C.H., Tay, T.M.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61916
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Institution: National University of Singapore
Description
Summary:Applied Surface Science