Correlation between the infrared reflectance and microstructure of thin gallium nitride films grown on silicon substrates

Correlation between the infrared reflectance and microstructure of thin gallium nitride films grown on silicon substrates

10.1016/S0038-1098(00)00134-4

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Bibliographic Details
Main Authors: Hou, Y.T., Feng, Z.C., Chen, J., Zhang, X., Chua, S.J., Lin, J.Y.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61979
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/61979

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