Correlation between the infrared reflectance and microstructure of thin gallium nitride films grown on silicon substrates

• Main Authors: Hou, Y.T., Feng, Z.C., Chen, J., Zhang, X., Chua, S.J., Lin, J.Y.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/61979
• Institution: National University of Singapore

10.1016/S0038-1098(00)00134-4