Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device

Microelectronics Reliability

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Main Authors:	Heiderhoff, R., Palaniappan, M., Phang, J.C.H., Balk, L.J.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/61980
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-61980
record_format	dspace
spelling	sg-nus-scholar.10635-619802015-01-19T20:44:20Z Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device Heiderhoff, R. Palaniappan, M. Phang, J.C.H. Balk, L.J. ELECTRICAL ENGINEERING Microelectronics Reliability 40 8-10 1383-1388 MCRLA 2014-06-17T06:46:08Z 2014-06-17T06:46:08Z 2000 Article Heiderhoff, R.,Palaniappan, M.,Phang, J.C.H.,Balk, L.J. (2000). Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device. Microelectronics Reliability 40 (8-10) : 1383-1388. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/61980 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Microelectronics Reliability
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Heiderhoff, R. Palaniappan, M. Phang, J.C.H. Balk, L.J.
format	Article
author	Heiderhoff, R. Palaniappan, M. Phang, J.C.H. Balk, L.J.
spellingShingle	Heiderhoff, R. Palaniappan, M. Phang, J.C.H. Balk, L.J. Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
author_sort	Heiderhoff, R.
title	Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
title_short	Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
title_full	Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
title_fullStr	Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
title_full_unstemmed	Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
title_sort	correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue gan light emitting device
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/61980
_version_	1681085692159983616

Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device

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