Design and characterisation of a single-reflection, solid-state detector with high discrimination against backscattered electrons for cathodoluminescence microscopy

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Bibliographic Details
Main Authors: Pey, K.L., Phang, J.C.H., Chan, D.S.H., Leong, Y.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62001
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Institution: National University of Singapore
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