Improving the speed of scanning electron microscope deflection systems

10.1088/0957-0233/10/11/316

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Main Authors: Lee, K.W., Thong, J.T.L.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62326
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-623262023-09-21T20:52:10Z Improving the speed of scanning electron microscope deflection systems Lee, K.W. Thong, J.T.L. ELECTRICAL ENGINEERING Electromagnetic deflection Scanning electron microscope 10.1088/0957-0233/10/11/316 Measurement Science and Technology 10 11 1070-1074 MSTCE 2014-06-17T06:49:50Z 2014-06-17T06:49:50Z 1999-11 Article Lee, K.W., Thong, J.T.L. (1999-11). Improving the speed of scanning electron microscope deflection systems. Measurement Science and Technology 10 (11) : 1070-1074. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/10/11/316 09570233 http://scholarbank.nus.edu.sg/handle/10635/62326 000083648300017 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Electromagnetic deflection
Scanning electron microscope
spellingShingle Electromagnetic deflection
Scanning electron microscope
Lee, K.W.
Thong, J.T.L.
Improving the speed of scanning electron microscope deflection systems
description 10.1088/0957-0233/10/11/316
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Lee, K.W.
Thong, J.T.L.
format Article
author Lee, K.W.
Thong, J.T.L.
author_sort Lee, K.W.
title Improving the speed of scanning electron microscope deflection systems
title_short Improving the speed of scanning electron microscope deflection systems
title_full Improving the speed of scanning electron microscope deflection systems
title_fullStr Improving the speed of scanning electron microscope deflection systems
title_full_unstemmed Improving the speed of scanning electron microscope deflection systems
title_sort improving the speed of scanning electron microscope deflection systems
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/62326
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