Improving the speed of scanning electron microscope deflection systems
10.1088/0957-0233/10/11/316
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sg-nus-scholar.10635-623262023-09-21T20:52:10Z Improving the speed of scanning electron microscope deflection systems Lee, K.W. Thong, J.T.L. ELECTRICAL ENGINEERING Electromagnetic deflection Scanning electron microscope 10.1088/0957-0233/10/11/316 Measurement Science and Technology 10 11 1070-1074 MSTCE 2014-06-17T06:49:50Z 2014-06-17T06:49:50Z 1999-11 Article Lee, K.W., Thong, J.T.L. (1999-11). Improving the speed of scanning electron microscope deflection systems. Measurement Science and Technology 10 (11) : 1070-1074. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/10/11/316 09570233 http://scholarbank.nus.edu.sg/handle/10635/62326 000083648300017 Scopus |
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Electromagnetic deflection Scanning electron microscope |
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Electromagnetic deflection Scanning electron microscope Lee, K.W. Thong, J.T.L. Improving the speed of scanning electron microscope deflection systems |
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10.1088/0957-0233/10/11/316 |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Lee, K.W. Thong, J.T.L. |
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Article |
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Lee, K.W. Thong, J.T.L. |
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Lee, K.W. |
title |
Improving the speed of scanning electron microscope deflection systems |
title_short |
Improving the speed of scanning electron microscope deflection systems |
title_full |
Improving the speed of scanning electron microscope deflection systems |
title_fullStr |
Improving the speed of scanning electron microscope deflection systems |
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Improving the speed of scanning electron microscope deflection systems |
title_sort |
improving the speed of scanning electron microscope deflection systems |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/62326 |
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