On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress
10.1016/S0026-2714(99)00053-0
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sg-nus-scholar.10635-625412023-10-30T20:52:19Z On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress Ang, D.S. Ling, C.H. ELECTRICAL ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME 10.1016/S0026-2714(99)00053-0 Microelectronics Reliability 39 9 1311-1322 MCRLA 2014-06-17T06:52:11Z 2014-06-17T06:52:11Z 1999-09 Article Ang, D.S., Ling, C.H. (1999-09). On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress. Microelectronics Reliability 39 (9) : 1311-1322. ScholarBank@NUS Repository. https://doi.org/10.1016/S0026-2714(99)00053-0 00262714 http://scholarbank.nus.edu.sg/handle/10635/62541 000083659500001 Scopus |
| institution |
National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| description |
10.1016/S0026-2714(99)00053-0 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H. |
| format |
Article |
| author |
Ang, D.S. Ling, C.H. |
| spellingShingle |
Ang, D.S. Ling, C.H. On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress |
| author_sort |
Ang, D.S. |
| title |
On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress |
| title_short |
On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress |
| title_full |
On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress |
| title_fullStr |
On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress |
| title_full_unstemmed |
On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress |
| title_sort |
on the time-dependent degradation of ldd n-mosfets under hot-carrier stress |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62541 |
| _version_ |
1781782152387493888 |