On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress
10.1016/S0026-2714(99)00053-0
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| Main Authors: | , |
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| Other Authors: | |
| Format: | Article |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62541 |
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| Institution: | National University of Singapore |
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