Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

Annual Proceedings - Reliability Physics (Symposium)

Saved in:

Bibliographic Details
Main Authors:	Chin, J.M., Phang, J.C.H., Chan, D.S.H., Soh, C.E., Gilfeather, G.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62780
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-62780
record_format	dspace
spelling	sg-nus-scholar.10635-627802015-01-16T13:54:29Z Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G. ELECTRICAL ENGINEERING Annual Proceedings - Reliability Physics (Symposium) 420-424 ARLPB 2014-06-17T06:54:47Z 2014-06-17T06:54:47Z 2000 Article Chin, J.M.,Phang, J.C.H.,Chan, D.S.H.,Soh, C.E.,Gilfeather, G. (2000). Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique. Annual Proceedings - Reliability Physics (Symposium) : 420-424. ScholarBank@NUS Repository. 00999512 http://scholarbank.nus.edu.sg/handle/10635/62780 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Annual Proceedings - Reliability Physics (Symposium)
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G.
format	Article
author	Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G.
spellingShingle	Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G. Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
author_sort	Chin, J.M.
title	Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_short	Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_full	Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_fullStr	Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_full_unstemmed	Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_sort	single contact optical beam induced currents (scobic) - a new failure analysis technique
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62780
_version_	1681085838302117888

Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

Similar Items