Analysis of step-stress accelerated-life-test data: a new approach
10.1109/24.488919
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sg-nus-scholar.10635-630252023-10-30T08:48:34Z Analysis of step-stress accelerated-life-test data: a new approach Tang, L.C. Sun, Y.S. Goh, T.N. Ong, H.L. INDUSTRIAL & SYSTEMS ENGINEERING Accelerated life test Cumulative exposure model Maximum likelihood estimator (mle) Step-stress Weibull distribution 10.1109/24.488919 IEEE Transactions on Reliability 45 1 69-74 IEERA 2014-06-17T06:59:17Z 2014-06-17T06:59:17Z 1996 Article Tang, L.C., Sun, Y.S., Goh, T.N., Ong, H.L. (1996). Analysis of step-stress accelerated-life-test data: a new approach. IEEE Transactions on Reliability 45 (1) : 69-74. ScholarBank@NUS Repository. https://doi.org/10.1109/24.488919 00189529 http://scholarbank.nus.edu.sg/handle/10635/63025 A1996UG99300018 Scopus |
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Accelerated life test Cumulative exposure model Maximum likelihood estimator (mle) Step-stress Weibull distribution |
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Accelerated life test Cumulative exposure model Maximum likelihood estimator (mle) Step-stress Weibull distribution Tang, L.C. Sun, Y.S. Goh, T.N. Ong, H.L. Analysis of step-stress accelerated-life-test data: a new approach |
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10.1109/24.488919 |
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INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Tang, L.C. Sun, Y.S. Goh, T.N. Ong, H.L. |
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Article |
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Tang, L.C. Sun, Y.S. Goh, T.N. Ong, H.L. |
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Tang, L.C. |
title |
Analysis of step-stress accelerated-life-test data: a new approach |
title_short |
Analysis of step-stress accelerated-life-test data: a new approach |
title_full |
Analysis of step-stress accelerated-life-test data: a new approach |
title_fullStr |
Analysis of step-stress accelerated-life-test data: a new approach |
title_full_unstemmed |
Analysis of step-stress accelerated-life-test data: a new approach |
title_sort |
analysis of step-stress accelerated-life-test data: a new approach |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/63025 |
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