Analysis of step-stress accelerated-life-test data: a new approach

Analysis of step-stress accelerated-life-test data: a new approach

10.1109/24.488919

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Bibliographic Details
Main Authors: Tang, L.C., Sun, Y.S., Goh, T.N., Ong, H.L.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Accelerated life test
Cumulative exposure model
Maximum likelihood estimator (mle)
Step-stress
Weibull distribution
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63025
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/63025

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