Analysis of step-stress accelerated-life-test data: a new approach

• Main Authors: Tang, L.C., Sun, Y.S., Goh, T.N., Ong, H.L.
• 其他作者: INDUSTRIAL & SYSTEMS ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Accelerated life test; Cumulative exposure model; Maximum likelihood estimator (mle); Step-stress; Weibull distribution
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/63025
• 機構: National University of Singapore

10.1109/24.488919