Planning accelerated life tests under scheduled inspections for log-location-scale distributions

IEEE Transactions on Reliability

Saved in:
Bibliographic Details
Main Authors: Liu, X., Tang, L.-C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63258
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:IEEE Transactions on Reliability