Planning accelerated life tests under scheduled inspections for log-location-scale distributions
IEEE Transactions on Reliability
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Main Authors: | Liu, X., Tang, L.-C. |
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Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/63258 |
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Institution: | National University of Singapore |
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