Planning accelerated life tests under scheduled inspections for log-location-scale distributions

IEEE Transactions on Reliability

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Bibliographic Details
Main Authors: Liu, X., Tang, L.-C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63258
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Institution: National University of Singapore
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