Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies

10.1109/24.475974

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Main Authors: Tang, Loon Ching, Chang, Dong Shang
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63293
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-632932015-03-23T13:38:01Z Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies Tang, Loon Ching Chang, Dong Shang INDUSTRIAL & SYSTEMS ENGINEERING 10.1109/24.475974 IEEE Transactions on Reliability 44 4 562-566 IEERA 2014-06-17T07:02:24Z 2014-06-17T07:02:24Z 1995-12 Article Tang, Loon Ching,Chang, Dong Shang (1995-12). Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies. IEEE Transactions on Reliability 44 (4) : 562-566. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/24.475974" target="_blank">https://doi.org/10.1109/24.475974</a> 00189529 http://scholarbank.nus.edu.sg/handle/10635/63293 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/24.475974
author2 INDUSTRIAL & SYSTEMS ENGINEERING
author_facet INDUSTRIAL & SYSTEMS ENGINEERING
Tang, Loon Ching
Chang, Dong Shang
format Article
author Tang, Loon Ching
Chang, Dong Shang
spellingShingle Tang, Loon Ching
Chang, Dong Shang
Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
author_sort Tang, Loon Ching
title Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
title_short Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
title_full Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
title_fullStr Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
title_full_unstemmed Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
title_sort reliability prediction using nondestructive accelerated-degradation data: case study on power supplies
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/63293
_version_ 1681085932200001536