Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
10.1109/24.475974
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Main Authors: | Tang, Loon Ching, Chang, Dong Shang |
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Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/63293 |
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Institution: | National University of Singapore |
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