SPC of a near zero-defect process subject to random shocks

Quality and Reliability Engineering International

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Main Authors: Xie, M., Goh, T.N.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63337
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-633372015-05-19T11:43:26Z SPC of a near zero-defect process subject to random shocks Xie, M. Goh, T.N. INDUSTRIAL & SYSTEMS ENGINEERING Quality and Reliability Engineering International 9 2 89-93 QREIE 2014-06-17T07:02:53Z 2014-06-17T07:02:53Z 1993-03 Article Xie, M.,Goh, T.N. (1993-03). SPC of a near zero-defect process subject to random shocks. Quality and Reliability Engineering International 9 (2) : 89-93. ScholarBank@NUS Repository. 07488017 http://scholarbank.nus.edu.sg/handle/10635/63337 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Quality and Reliability Engineering International
author2 INDUSTRIAL & SYSTEMS ENGINEERING
author_facet INDUSTRIAL & SYSTEMS ENGINEERING
Xie, M.
Goh, T.N.
format Article
author Xie, M.
Goh, T.N.
spellingShingle Xie, M.
Goh, T.N.
SPC of a near zero-defect process subject to random shocks
author_sort Xie, M.
title SPC of a near zero-defect process subject to random shocks
title_short SPC of a near zero-defect process subject to random shocks
title_full SPC of a near zero-defect process subject to random shocks
title_fullStr SPC of a near zero-defect process subject to random shocks
title_full_unstemmed SPC of a near zero-defect process subject to random shocks
title_sort spc of a near zero-defect process subject to random shocks
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/63337
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