SPC of a near zero-defect process subject to random shocks

Quality and Reliability Engineering International

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Bibliographic Details
Main Authors: Xie, M., Goh, T.N.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/63337
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Institution: National University of Singapore
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