SPC of a near zero-defect process subject to random shocks
Quality and Reliability Engineering International
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Main Authors: | Xie, M., Goh, T.N. |
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Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/63337 |
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Institution: | National University of Singapore |
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