Polarization retention on short, intermediate, and long time scales in ferroelectric thin films

10.1063/1.3106663

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Bibliographic Details
Main Author: Lou, X.J.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/64978
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Institution: National University of Singapore

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