Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))

10.1109/TMTT.2010.2052407

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Main Authors:	Ooi, B.L., Zhong, Z., Leong, M.-S.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Others
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/67927
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-679272023-10-31T07:31:04Z Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261)) Ooi, B.L. Zhong, Z. Leong, M.-S. ELECTRICAL & COMPUTER ENGINEERING 10.1109/TMTT.2010.2052407 IEEE Transactions on Microwave Theory and Techniques 58 8 2314- IETMA 2014-06-18T05:32:35Z 2014-06-18T05:32:35Z 2010-08 Others Ooi, B.L., Zhong, Z., Leong, M.-S. (2010-08). Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261)). IEEE Transactions on Microwave Theory and Techniques 58 (8) : 2314-. ScholarBank@NUS Repository. https://doi.org/10.1109/TMTT.2010.2052407 00189480 http://scholarbank.nus.edu.sg/handle/10635/67927 000283057400027 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1109/TMTT.2010.2052407
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ooi, B.L. Zhong, Z. Leong, M.-S.
format	Others
author	Ooi, B.L. Zhong, Z. Leong, M.-S.
spellingShingle	Ooi, B.L. Zhong, Z. Leong, M.-S. Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
author_sort	Ooi, B.L.
title	Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
title_short	Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
title_full	Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
title_fullStr	Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
title_full_unstemmed	Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
title_sort	erratum: analytical extraction of extrinsic and intrinsic fet parameters (ieee transactions on microwave theory and techniques (2009) 57: 2 (254-261))
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/67927
_version_	1781782940854779904

Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))

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