Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
10.1109/TMTT.2010.2052407
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Main Authors: | Ooi, B.L., Zhong, Z., Leong, M.-S. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Others |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/67927 |
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Institution: | National University of Singapore |
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