Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))

10.1109/TMTT.2010.2052407

Saved in:
Bibliographic Details
Main Authors: Ooi, B.L., Zhong, Z., Leong, M.-S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Others
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/67927
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first