Comment on "Steady-state temperature profile for a thin-film resistor under bias" [J. Appl. Phys. 72, 3862 (1992)]
10.1063/1.355308
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| Format: | Review |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/68171 |
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| Institution: | National University of Singapore |