Abnormal temperature dependence of exchange bias in the NiFe5/Ta0.2/IrMn8 system

Abnormal temperature dependence of exchange bias in the NiFe5/Ta0.2/IrMn8 system

10.1063/1.1555333

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Bibliographic Details
Main Authors: Li, K., Guo, Z., Han, G., Qiu, J., Wu, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69135
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Institution: National University of Singapore
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Summary:10.1063/1.1555333

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